@Article{HasarBarKayButErt:2014:SiPrRo,
author = "Hasar, Ugur Cem and Barroso, Joaquim Jos{\'e} and Kaya, Yunus and
Bute, M. and Ertugrul, Mehmet",
affiliation = "{University of Gaziantep} and {Instituto Nacional de Pesquisas
Espaciais (INPE)} and {Bayburt University} and {University of
Gaziantep} and {Ataturk University}",
title = "Simple procedure for robust and accurate complex permittivity
measurements of low-loss materials over a broad frequency band",
journal = "Journal of Electromagnetic Waves and Applications",
year = "2014",
volume = "28",
number = "8",
pages = "903--915",
keywords = "materials testing, microwave measurements, permittivity, low-loss
samples.",
abstract = "In this research paper, we propose a simple procedure for
accurate, stable and broadband measurements of complex
permittivity of low-loss dielectric samples with considerable
lengths. We identify and demonstrate by numerical and analytical
analyses the main ill-behaved factor that gives rise to inaccurate
peaks for measurements of electrical properties of low-loss
samples in the well-known Nicolson-Ross-Weir method. Without using
this factor in the expressions and combining better features of
the methods available in the literature, the proposed procedure
allows highly accurate permittivity measurements over a broad
band. We have validated the proposed method by permittivity
measurements of a low-loss sample by different methods.",
doi = "10.1080/09205071.2014.896227",
url = "http://dx.doi.org/10.1080/09205071.2014.896227",
issn = "0920-5071",
label = "scopus 2014-05 HasarBarKayButErt:2014:SiPrRo",
language = "en",
urlaccessdate = "27 abr. 2024"
}